This title appears in the Scientific Report :
2009
Tip Enhanced Raman Spectroscopy for High Resolution Assessment of Strained Silicon Devices
Tip Enhanced Raman Spectroscopy for High Resolution Assessment of Strained Silicon Devices
Saved in:
Personal Name(s): | Sanderson, L. |
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Dobrosz, P. / Olsen, S.H. / Bull, S.J. / Buca, D. / Mantl, S. | |
Contributing Institute: |
Halbleiter-Nanoelektronik; IBN-1 JARA-FIT; JARA-FIT |
Published in: |
The International Conference on Metallurgical Coating and Thin Films - ICMCTF 2009 |
Imprint: |
2009
|
Conference: | San Diego, USA 2009-04-27 |
Document Type: |
Conference Presentation |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |