This title appears in the Scientific Report :
2005
Tracer tests at Krauthausen: non-invasive monitoring using electrical resistivity tomography and predictive modeling on the basis of cone penetration test data
Tracer tests at Krauthausen: non-invasive monitoring using electrical resistivity tomography and predictive modeling on the basis of cone penetration test data
Saved in:
Personal Name(s): | Müller, K. |
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Englert, A. / Kemna, A. / Vanderborght, J. / Vereecken, H. | |
Contributing Institute: |
Agrosphäre; ICG-IV |
Published in: |
AGU Fall Meeting 2005 |
Imprint: |
2005
|
Conference: | San Francisco, CA 2005-12-05 |
Document Type: |
Poster |
Research Program: |
Chemie und Dynamik der Geo-Biosphäre |
Publikationsportal JuSER |
Description not available. |