This title appears in the Scientific Report :
2005
Please use the identifier:
http://dx.doi.org/10.1016/j.actamat.2005.07.033 in citations.
Ionic conduction in zirconia films on nanometer thickness
Ionic conduction in zirconia films on nanometer thickness
Polycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the...
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Personal Name(s): | Guo, X. |
---|---|
Vasco, E. / Mi, S. / Szot, K. / Wachsman, E. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; IFF-IEM |
Published in: | Acta materialia, 53 (2005) S. 5161 |
Imprint: |
Amsterdam [u.a.]
Elsevier Science
2005
|
Physical Description: |
5161 |
DOI: |
10.1016/j.actamat.2005.07.033 |
Document Type: |
Journal Article |
Research Program: |
Kondensierte Materie |
Series Title: |
Acta Materialia
53 |
Subject (ZB): | |
Publikationsportal JuSER |
Polycrystalline 8 mol% Y2O3-stabilized ZrO2 films with thicknesses of 12 and 25 nm were deposited on (100) MgO substrates, their nanostructures were investigated by means of transmission electron microscopy (TEM), high-resolution TEM and atomic force microscopy, and the electrical properties of the nanostructured films were characterized in dry and humid O-2. Compared with microcrystalline bulk ceramics, the ionic conductivity of the nanostructured films is lower by about a factor of 4, which is mainly due to the lower bulk conductivity and the low grain-boundary conductivity. There is not remarkable proton conduction in the nanostructured films when annealed in water vapor, and the influence of the ZrO2/MgO interface on its ionic conduction is negligible. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved. |