This title appears in the Scientific Report :
2005
Please use the identifier:
http://hdl.handle.net/2128/1096 in citations.
Please use the identifier: http://dx.doi.org/10.1063/1.1922579 in citations.
Misfit dislocations in nanoscale ferroelectric heterostructures
Misfit dislocations in nanoscale ferroelectric heterostructures
We present a quantitative study of the thickness dependence of the polarization and piezoelectric properties in epitaxial (001) PbZr0.52Ti0.48O3 films grown on (001) SrRuO3-buffered (001) SrTiO3 substrates. High-resolution transmission electron microscopy reveals that even the thinnest films (simila...
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Personal Name(s): | Nagarajan, V. |
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Jia, C. L. / Kohlstedt, H. / Waser, R. / Misirlioglu, I. B. / Alpay, S. P. / Ramesh, R. | |
Contributing Institute: |
Center of Nanoelectronic Systems for Information Technology; CNI Mikrostrukturforschung; IFF-IMF Elektronische Materialien; IFF-IEM |
Published in: | Applied physics letters, 86 (2005) S. 192910 |
Imprint: |
Melville, NY
American Institute of Physics
2005
|
Physical Description: |
192910 |
DOI: |
10.1063/1.1922579 |
Document Type: |
Journal Article |
Research Program: |
Materialien, Prozesse und Bauelemente für die Mikro- und Nanoelektronik |
Series Title: |
Applied Physics Letters
86 |
Subject (ZB): | |
Link: |
Get full text OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1063/1.1922579 in citations.
We present a quantitative study of the thickness dependence of the polarization and piezoelectric properties in epitaxial (001) PbZr0.52Ti0.48O3 films grown on (001) SrRuO3-buffered (001) SrTiO3 substrates. High-resolution transmission electron microscopy reveals that even the thinnest films (similar to 8 nm) are fully relaxed with a dislocation density close to 10(12) cm(-2) and a spacing of approximately 12 nm. Quantitative piezoelectric and ferroelectric measurements show a drastic degradation in the out-of-plane piezoelectric constant (d(33)) and the switched polarization (DP) as a function of decreasing thickness. In contrast, lattice-matched ultrathin PbZr0.2Ti0.8O3 films that have a very low dislocation density show superior ferroelectric properties. Supporting theoretical calculations show that the variations in the strain field around the core of the dislocation leads to highly localized polarization gradients and hence strong depolarizing fields, which result in suppression of ferroelectricity in the vicinity of a dislocation. (c) 2005 American Institute of Physics. |