This title appears in the Scientific Report :
2006
Time-resolved photoemission electron microscopy
Time-resolved photoemission electron microscopy
Saved in:
Personal Name(s): | Schönhense, G. |
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Elmers, H.-J. / Nepijko, S. A. / Schneider, C. M. | |
Contributing Institute: |
Elektronische Eigenschaften; IFF-IEE JARA-FIT; JARA-FIT |
Published in: |
Advances in Imaging and Electron Physics / ed.: P. Hawkes. - San Diego, Academic Press. - 142 (2006). - 0-12-014784-X. - S. 160 |
Imprint: |
2006
|
ISBN: |
0-12-014784-X |
Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |