This title appears in the Scientific Report :
2006
Soft x-ray photoemission electron microscopy
Soft x-ray photoemission electron microscopy
Saved in:
Personal Name(s): | Schneider, C. M. |
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Contributing Institute: |
Elektronische Eigenschaften; IFF-IEE |
Published in: |
Neutron and X-ray Spectroscopy / ed.: F. Hippert, E. Geissler, J.-L. Hodeau, E. Lelievre-Berna,J.-R. Regnard. - Kluwer Acad. Publ., 2006. - 1-402-03336-2. - S. 456 |
Imprint: |
2006
|
ISBN: |
1-402-03336-2 |
Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |