This title appears in the Scientific Report :
2006
Spherical aberration correction and exit-plane wave function reconstruction: Synergetic tools for the atomic-scale imaging of structural imperfections in semiconductor materials
Spherical aberration correction and exit-plane wave function reconstruction: Synergetic tools for the atomic-scale imaging of structural imperfections in semiconductor materials
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Personal Name(s): | Tillmann, K. |
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Thust, A. / Houben, L. / Luysberg, M. / Lentzen, M. / Urban, K. | |
Contributing Institute: |
Mikrostrukturforschung; IFF-IMF |
Published in: |
Proceedings of the 14th Conference on Microscopy of Semiconducting Materials, Oxford, UK, 11.04. - 14.04.2005 / ed.: A. G. Cullis, J. L. Hutchison. - Berlin, Springer, 2006. - 3-540-31914-X, 978-3-540-31914-6. - S. 183 - 190 |
Imprint: |
2006
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Kondensierte Materie |
Publikationsportal JuSER |
Description not available. |