Meneghesso, G., Rampazzo, F., Kordos, P., Verzellesi, G., & Zanoni, E. (2006). Current collapse and high-electric-field reliability of unpassivated GaN/AlGaN/GaN HEMTs.
Chicago Style CitationMeneghesso, G., F. Rampazzo, P. Kordos, G. Verzellesi, andfavorite E. Zanoni. Current Collapse and High-electric-field Reliability of Unpassivated GaN/AlGaN/GaN HEMTs. 2006.
MLA CitationMeneghesso, G., et al. Current Collapse and High-electric-field Reliability of Unpassivated GaN/AlGaN/GaN HEMTs. 2006.
Warning: These citations may not always be 100% accurate.