This title appears in the Scientific Report :
2010
Please use the identifier:
http://hdl.handle.net/2128/4400 in citations.
Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast
Hard X-Ray Microscopy with Elemental, Chemical, and Structural Contrast
We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparati...
Saved in:
Personal Name(s): | Schroer, C.G. |
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Boyer, P. / Feldkamp, J. / Patommel, J. / Schropp, A. / Samberg, D. / Stephan, S. / Burghammer, M. / Schröder, S. / Riekel, C. / Lengeler, B. / Falkenberg, G. / Wellenreuther, G. / Kuhlmann, M. / Frahm, R. / Lützenkirchen-Hecht, D. / Schröder, W. H. | |
Contributing Institute: |
Phytosphäre; ICG-3 |
Published in: | Acta physica Polonica / A, 117 (2010) S. 357 - 368 |
Published in: |
ACTA PHYSICA POLONICA A 2010 (2), Vol. 117, 357 |
Imprint: |
Warsaw
Acad. Inst.
2010
|
Physical Description: |
357 - 368 |
Document Type: |
Journal Article |
Research Program: |
Terrestrische Umwelt |
Series Title: |
Acta Physica Polonica A
117 |
Link: |
OpenAccess |
Publikationsportal JuSER |
We review hard X-ray microscopy techniques with a focus on scanning microscopy with synchrotron radiation. Its strength compared to other microscopies is the large penetration depth of hard x rays in matter that allows one to investigate the interior of an object without destructive sample preparation. In combination with tomography, local information from inside of a specimen can be obtained, even from inside special non-ambient sample environments. Different X-ray analytical techniques can be used to produce contrast, such as X-ray absorption, fluorescence, and diffraction, to yield chemical, elemental, and structural information about the sample, respectively. This makes X-ray microscopy attractive to many fields of science, ranging from physics and chemistry to materials, geo-, and environmental science, biomedicine, and nanotechnology. Our scanning microscope based on nanofocusing refractive X-ray lenses has a routine spatial resolution of about 100 nm and supports the contrast mechanisms mentioned above. In combination with coherent X-ray diffraction imaging, the spatial resolution can be improved to the 10 nm range. The current state-of-the-art of this technique is illustrated by several examples, and future prospects of the technique are given. |