This title appears in the Scientific Report :
2006
Please use the identifier:
http://dx.doi.org/10.1524/zksu.2006.suppl_23.299 in citations.
Residual stress mapping in the zirconia electrolyte layer of a high-temperature solid oxide fuel cell
Residual stress mapping in the zirconia electrolyte layer of a high-temperature solid oxide fuel cell
X-ray residual stress evaluation has been employed to measure stress distributions in the electrolyte layer of a single anode-supported planar solid oxide fuel cell at several manufacturing steps. The mainly thermal residual stress in the about 10 gm thick electrolyte layer is about -560 MPa at room...
Saved in:
Personal Name(s): | Fischer, W. |
---|---|
Blass, G. | |
Contributing Institute: |
Werkstoffsynthese und Herstellungsverfahren; IWV-1 |
Published in: | Zeitschrift für Kristallographie / Crystalline materials (2006) S. 299 - 304 |
Imprint: |
München
Oldenbourg
2006
|
Physical Description: |
299 - 304 |
DOI: |
10.1524/zksu.2006.suppl_23.299 |
Document Type: |
Journal Article |
Research Program: |
Rationelle Energieumwandlung |
Series Title: |
Zeitschrift für Kristallographie
|
Subject (ZB): | |
Publikationsportal JuSER |
X-ray residual stress evaluation has been employed to measure stress distributions in the electrolyte layer of a single anode-supported planar solid oxide fuel cell at several manufacturing steps. The mainly thermal residual stress in the about 10 gm thick electrolyte layer is about -560 MPa at room temperature and constant across the whole cell plate. Chemical reduction of the anode leads to a slight reduction of the compressive stress to -520 MPa, still ensuring that the electrolyte layer remains under compression up to operation temperature of about 800 degrees C. |