This title appears in the Scientific Report :
2007
Determination of the atomic hydrogen to silicon growth flux ratio controlling the microcrystalline to amorphus silicon phase transition by the etch product detection technique
Determination of the atomic hydrogen to silicon growth flux ratio controlling the microcrystalline to amorphus silicon phase transition by the etch product detection technique
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Personal Name(s): | Dingemans, G. |
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van den Donker, M. N. / Hrunski, D. / Gordijn, A. / Kessels, W. M. M. / van de Sanden, M. C. M. | |
Contributing Institute: |
Photovoltaik; IEF-5 |
Published in: |
22nd International Conference on Amorphous and Nanocrystalline Semiconductors |
Imprint: |
2007
|
Conference: | Breckenridge, Colo. 2007-08-19 |
Document Type: |
Conference Presentation |
Research Program: |
Erneuerbare Energien |
Publikationsportal JuSER |
Description not available. |