This title appears in the Scientific Report :
2007
Please use the identifier:
http://dx.doi.org/10.1007/s00339-007-4085-7 in citations.
Magnetic stray fields of patterned permalloy structures investigated by photoemission electron microscopy
Magnetic stray fields of patterned permalloy structures investigated by photoemission electron microscopy
Using a photoemission electron microscope we determined magnetic stray fields at the edges of permalloy (Ni80Fe20) particles. X-ray magnetic dichroism was used for visualization of magnetic domains. The values of the stray fields were deduced from the deflection of electrons in the image due to the...
Saved in:
Personal Name(s): | Krasyuk, A. |
---|---|
Nepijko, S. A. / Oelsner, A. / Schneider, C. M. / Elmers, H. J. / Schönhense, G. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: | Applied physics / A, 88 (2007) S. 793 - 796 |
Imprint: |
Berlin
Springer
2007
|
Physical Description: |
793 - 796 |
DOI: |
10.1007/s00339-007-4085-7 |
Document Type: |
Journal Article |
Research Program: |
Kondensierte Materie |
Series Title: |
Applied Physics A
88 |
Subject (ZB): | |
Publikationsportal JuSER |
Using a photoemission electron microscope we determined magnetic stray fields at the edges of permalloy (Ni80Fe20) particles. X-ray magnetic dichroism was used for visualization of magnetic domains. The values of the stray fields were deduced from the deflection of electrons in the image due to the Lorentz force. The stray fields are responsible for the magnetic interaction of adjacent particles with distances much larger than the thickness. The measured magnetic stray field is about 0.023 T for rectangular particles with a thickness of 30 nm and lateral sizes of tens of microns. |