This title appears in the Scientific Report :
2000
Scanning tunneling microscopy of defects in quasiperiodically ordered surfaces
Scanning tunneling microscopy of defects in quasiperiodically ordered surfaces
Saved in:
Personal Name(s): | Ebert, P. |
---|---|
Chao, K. J. / Niu, Q. / Shih, C. K. / Plummer, E. W. / Urban, K. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Materials science and engineering / A, 294/296 (2000) S. 826 - 829 |
Imprint: |
Amsterdam
Elsevier
2000
|
Physical Description: |
826 - 829 |
Document Type: |
Journal Article |
Research Program: |
Erforschung neuer Materialien |
Series Title: |
Materials Science and Engineering A
294/296 |
Publikationsportal JuSER |
Description not available. |