This title appears in the Scientific Report :
2000
Please use the identifier:
http://hdl.handle.net/2128/880 in citations.
Lifetime estimation due to imprint failure in ferroelectric SrBi2 Ta2O9 thin films
Lifetime estimation due to imprint failure in ferroelectric SrBi2 Ta2O9 thin films
Saved in:
Personal Name(s): | Grossmann, M. |
---|---|
Lohse, O. / Bolten, D. / Böttger, U. / Waser, R. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Applied physics letters, 76 (2000) S. 363 - 365 |
Imprint: |
Melville, NY
American Institute of Physics
2000
|
Physical Description: |
363 - 365 |
Document Type: |
Journal Article |
Research Program: |
Festkörperforschung für die Informationstechnik |
Series Title: |
Applied Physics Letters
76 |
Link: |
OpenAccess |
Publikationsportal JuSER |
Description not available. |