This title appears in the Scientific Report :
2000
Please use the identifier:
http://hdl.handle.net/2128/883 in citations.
Soft X-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers
Soft X-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers
By separately identifying magnetic and charge scatter, we find conclusive evidence for conformality in magnetic roughness in {Co (8 Angstrom) Cu (9 Angstrom)} multilayers. For layers magnetized in the easy direction, the magnetic roughness equals the structural roughness but increases when magnetize...
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Personal Name(s): | Hase, T. P. A. |
---|---|
Pape, I. / Tanner, B. K. / Dürr, H. A. / Dudzik, E. / van der Laan, G. / Marrows, C. H. / Hickey, B. J. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Physical review / B, 61 (2000) S. R3792 |
Imprint: |
College Park, Md.
APS
2000
|
Physical Description: |
R3792 |
Document Type: |
Journal Article |
Research Program: |
Elektronische Struktur von Festkörpern, Oberflächen und Schichtsystemen |
Series Title: |
Physical Review B
61 |
Subject (ZB): | |
Link: |
OpenAccess |
Publikationsportal JuSER |
By separately identifying magnetic and charge scatter, we find conclusive evidence for conformality in magnetic roughness in {Co (8 Angstrom) Cu (9 Angstrom)} multilayers. For layers magnetized in the easy direction, the magnetic roughness equals the structural roughness but increases when magnetized in the hard direction. The in-plane magnetic correlation length, which changes on magnetization is several orders of magnitude larger than the structural roughness length scales. The magnetic length scale is bf the same order as;magnetic ripple observed in Lorentz microscopy and is not associated with domains. |