This title appears in the Scientific Report :
2008
Please use the identifier:
http://dx.doi.org/10.1063/1.2841917 in citations.
Please use the identifier: http://hdl.handle.net/2128/17369 in citations.
Method to distinguish ferroelectric from nonferroelectric origin in case of resistive switching in ferroelectric capacitors
Method to distinguish ferroelectric from nonferroelectric origin in case of resistive switching in ferroelectric capacitors
We present investigations on the resistive switching effect in SrRuO3/PbZr0.2Ti0.8O3/Pt ferroelectric capacitors. Using a conductive atomic force microscope, the out-of-plane piezoelectric response and the capacitive and resistive current were simultaneously measured as a function of applied bias vo...
Saved in:
Personal Name(s): | Kohlstedt, H. H. |
---|---|
Petraru, A. / Szot, K. / Rüdiger, A. / Meuffels, P. / Haselier, H. / Waser, R. / Nagarajan, V. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: | Applied physics letters, 92 (2008) S. 062907 |
Imprint: |
Melville, NY
American Institute of Physics
2008
|
Physical Description: |
062907 |
DOI: |
10.1063/1.2841917 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Applied Physics Letters
92 |
Subject (ZB): | |
Link: |
Get full text OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/17369 in citations.
We present investigations on the resistive switching effect in SrRuO3/PbZr0.2Ti0.8O3/Pt ferroelectric capacitors. Using a conductive atomic force microscope, the out-of-plane piezoelectric response and the capacitive and resistive current were simultaneously measured as a function of applied bias voltage. We observed two independent switching phenomena, one attributed to the ferroelectric switching process and the other to resistive switching. We show that I-V curves alone are not sufficient in ferroelectric materials to clarify the underlying switching mechanism and must be used with sufficient caution. (C) 2008 American Institute of Physics. |