This title appears in the Scientific Report :
2008
Please use the identifier:
http://dx.doi.org/10.1063/1.2838346 in citations.
Please use the identifier: http://hdl.handle.net/2128/17112 in citations.
Direct electrical characterization of embedded ferroelectric lead titanate nanoislands
Direct electrical characterization of embedded ferroelectric lead titanate nanoislands
We report on the fabrication and characterization of lead titanate nanoislands on platinized silicon substrates embedded into a low-k dielectric. Our findings with Pt and Au as collective top electrodes are compared to previous results and thin films, and we discuss the coercive field and the remane...
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Personal Name(s): | Clemens, S. |
---|---|
Dippel, A. C. / Schneller, T. / Waser, R. / Rüdiger, A. / Röhrig, S. | |
Contributing Institute: |
Elektronische Materialien; IFF-6 JARA-FIT; JARA-FIT |
Published in: | Journal of applied physics, 103 (2008) S. 034113 |
Imprint: |
Melville, NY
American Institute of Physics
2008
|
Physical Description: |
034113 |
DOI: |
10.1063/1.2838346 |
Document Type: |
Journal Article |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Series Title: |
Journal of Applied Physics
103 |
Subject (ZB): | |
Link: |
Get full text OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/17112 in citations.
We report on the fabrication and characterization of lead titanate nanoislands on platinized silicon substrates embedded into a low-k dielectric. Our findings with Pt and Au as collective top electrodes are compared to previous results and thin films, and we discuss the coercive field and the remanent polarization with special care devoted to capacitive and leakage contributions of the nonpolar matrix. A direct electrical characterization of sub-100-nm ferroelectric nanoislands becomes feasible if they are measured in parallel, providing that the thin film material parameters of both ferroelectric and spin-on glass are independently determined. (c) 2008 American Institute of Physics. |