This title appears in the Scientific Report :
2009
Nanoscale charge transport measurements using a multi-tip scanning tunneling microscope
Nanoscale charge transport measurements using a multi-tip scanning tunneling microscope
Saved in:
Personal Name(s): | Jaschinsky, P. |
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Wensorra, J. / Lepsa, M. I. / Voigtländer, B. | |
Contributing Institute: |
Halbleiter-Nanoelektronik; IBN-1 Grenz- und Oberflächen; IBN-3 JARA-FIT; JARA-FIT |
Published in: |
Frühjahrstagung der Deutschen Physikalischen Gesellschaft 2009 |
Imprint: |
2009
|
Conference: | Dresden 2009-03-22 |
Document Type: |
Poster |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |