This title appears in the Scientific Report :
2008
Reliability and improved performance of AlGaN/GaN high electron mobility transistor structures
Reliability and improved performance of AlGaN/GaN high electron mobility transistor structures
Saved in:
Personal Name(s): | Vitusevich, S. A. |
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Kurakin, A. M. / Klein, N. / Petrychuk, M. V. / Naumov, A. V. / Belyaev, A. E. | |
Contributing Institute: |
Institut für Bio- und Nanosysteme - Bioelektronik; IBN-2 JARA-FIT; JARA-FIT |
Published in: |
Devices, Circuits and Systems, 2008 (ICCDCS 2008) : Proceedings of the 7th International Caribbean Conference on Devices, Circuits and Systems. - IEEE, 2008. - 978-1-4244-1957-9. - S. 1 - 5 |
Imprint: |
2008
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Document Type: |
Contribution to a book Contribution to a conference proceedings |
Research Program: |
Grundlagen für zukünftige Informationstechnologien |
Publikationsportal JuSER |
Description not available. |