This title appears in the Scientific Report :
2016
Please use the identifier:
http://dx.doi.org/10.1063/1.4953071 in citations.
Please use the identifier: http://hdl.handle.net/2128/17259 in citations.
Compact extreme ultraviolet source for laboratory-based photoemission spectromicroscopy
Compact extreme ultraviolet source for laboratory-based photoemission spectromicroscopy
We report on the combination of a state-of-the-art energy-filtering photoemission electron microscope with an intense yet compact laboratory-based gas discharge extreme ultraviolet (EUV) light source. Using a photon energy of 71.7 eV from oxygen plasma (O5+ spectral line), we demonstrate element-sel...
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Personal Name(s): | Schmitz, Christoph (Corresponding author) |
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Wilson, Daniel / Rudolf, Denis / Wiemann, Carsten / Plucinski, Lukasz / Riess, Sally / Schuck, Martin / Hardtdegen, Hilde / Schneider, Claus M. / Tautz, Frank Stefan / Juschkin, Larissa | |
Contributing Institute: |
JARA-FIT; JARA-FIT Quantum Nanoscience; PGI-3 Elektronische Eigenschaften; PGI-6 Halbleiter-Nanoelektronik; PGI-9 |
Published in: | Applied physics letters, 108 (2016) 23, S. 234101 - |
Imprint: |
Melville, NY
American Inst. of Physics
2016
|
DOI: |
10.1063/1.4953071 |
Document Type: |
Journal Article |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Link: |
OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/17259 in citations.
We report on the combination of a state-of-the-art energy-filtering photoemission electron microscope with an intense yet compact laboratory-based gas discharge extreme ultraviolet (EUV) light source. Using a photon energy of 71.7 eV from oxygen plasma (O5+ spectral line), we demonstrate element-selective photoelectron imaging in real space and band structure mapping in reciprocal space. Additionally, the high surface sensitivity of the EUV light was used to study the surface oxidation on islands of the phase-change material Ge1Sb2Te4. The EUV light source allows the extension of spectromicroscopy, previously only feasible at synchrotron beamlines, to laboratory-based work. |