This title appears in the Scientific Report :
2016
Please use the identifier:
http://dx.doi.org/10.1002/vipr.201600605 in citations.
The Multimeter at the Nanoscale
The Multimeter at the Nanoscale
A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. Complementing the instrument with a versatile measurement electronics creates a powerful tool to give insight into fundamental transport properties at the nanoscale....
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Personal Name(s): | Voigtländer, Bert (Corresponding author) |
---|---|
Cherepanov, Vasily / Coenen, Peter | |
Contributing Institute: |
Quantum Nanoscience; PGI-3 |
Published in: | Vakuum in Forschung und Praxis, 28 (2016) 3, S. 38 - 42 |
Imprint: |
Weinheim
Wiley-VCH
2016
|
DOI: |
10.1002/vipr.201600605 |
Document Type: |
Journal Article |
Research Program: |
Controlling Spin-Based Phenomena |
Publikationsportal JuSER |
A multi-tip scanning tunneling microscope (STM) specifically designed for charge transport measurements at the nanoscale is described. Complementing the instrument with a versatile measurement electronics creates a powerful tool to give insight into fundamental transport properties at the nanoscale. We demonstrate the capabilities of the instrument by measuring resistance profiles along freestanding GaAs nanowires, by the acquisition of nanoscale potential maps, and by the identification of an anisotropy in the surface conductivity at a silicon surface. |