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This title appears in the Scientific Report : 2016 

Evaluation of the dark signal performance of different SiPM-technologies under irradiation with cold neutrons

Evaluation of the dark signal performance of different SiPM-technologies under irradiation with cold neutrons

In this paper we report the results of the assessment of changes in the dark signal delivered by three silicon photomultiplier (SiPM) detector arrays, fabricated by three different manufacturers, when irradiated with cold neutrons (wavelength lambda = 5 Å or neutron energy of En = 3.27 meV) up to a...

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Personal Name(s): Durini, Daniel (Corresponding author)
Degenhardt, Carsten / Rongen, Heinz / Feoktystov, Artem / Schlösser, Mario / Palomino-Razo, Alejandro / Frielinghaus, Henrich / van Waasen, Stefan
Contributing Institute: Streumethoden; JCNS-2
Neutronenstreuung; JCNS-1
JCNS-FRM-II; JCNS-FRM-II
Zentralinstitut für Elektronik; ZEA-2
Published in: Nuclear instruments & methods in physics research / A, 835 (2016) S. 99 - 109
Imprint: Amsterdam North-Holland Publ. Co. 2016
DOI: 10.1016/j.nima.2016.08.016
Document Type: Journal Article
Research Program: Jülich Centre for Neutron Research (JCNS)
FRM II / MLZ
Quantum Condensed Matter: Magnetism, Superconductivity
Controlling Collective States
Subject (ZB):
Instrument and Method Development > 0
Key Technologies > 0
Publikationsportal JuSER
Please use the identifier: http://dx.doi.org/10.1016/j.nima.2016.08.016 in citations.

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In this paper we report the results of the assessment of changes in the dark signal delivered by three silicon photomultiplier (SiPM) detector arrays, fabricated by three different manufacturers, when irradiated with cold neutrons (wavelength lambda = 5 Å or neutron energy of En = 3.27 meV) up to a neutron dose of 6E12 n/cm2. The dark signals as well as the breakdown voltages (Vbr) of the SiPM detectors were monitored during the irradiation. The system was characterized at room temperature. The analog SiPM detectors, with and without a 1 mm thick Cerium doped 6Li-glass scintillator material located in front of them, were operated using a bias voltage recommended by the respective manufacturer for a proper detector performance. Iout-Vbias measurements, used to determine the breakdown voltage of the devices, were repeated every 30 s during the first hour and every 300 s during the rest of the irradiation time. The digital SiPM detectors were held at the advised bias voltage between the respective breakdown voltage and dark count mappings repeated every 4 minutes. The measurements were performed on the KWS-1 instrument of the Heinz Maier-Leibnitz Zentrum (MLZ) in Garching, Germany. The two analog and one digital SiPM detector modules under investigation were respectively fabricated by SensL (Ireland), Hamamatsu Photonics (Japan), and Philips Digital Photon Counting (Germany).

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