This title appears in the Scientific Report :
2000
The static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers
The static structure factor S(Q) of partially deuterated ethyl- and hexylmethacrylate polymers
We have performed measurements of the static structure factor S(Q) on Polyethylmethacrylate and Polyhexylmethacrylate on ROTAX at ambient T in the Q-range 0.5 < Q/Angstrom(-1) < 4.5 and on the DNS spectrometer at T = 8 K in the Q-range 0.1 < Q/Angstrom(-1) < 3.2 thereby including spin po...
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Personal Name(s): | Meier, G. |
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Pawelzik, U. / Schweika, W. / Kockelmann, W. | |
Contributing Institute: |
Institut für Festkörperforschung; IFF |
Published in: | Physica / B, 276/278 (2000) S. 369 - 370 |
Imprint: |
Amsterdam
North-Holland Physics Publ.
2000
|
Physical Description: |
369 - 370 |
Document Type: |
Journal Article |
Research Program: |
Methodenentwicklung für Synchrotron- und Neutronenstrahlung |
Series Title: |
Physica B: Condensed Matter
276/278 |
Subject (ZB): | |
Publikationsportal JuSER |
We have performed measurements of the static structure factor S(Q) on Polyethylmethacrylate and Polyhexylmethacrylate on ROTAX at ambient T in the Q-range 0.5 < Q/Angstrom(-1) < 4.5 and on the DNS spectrometer at T = 8 K in the Q-range 0.1 < Q/Angstrom(-1) < 3.2 thereby including spin polarization analysis. Each polymer was either deuterated at the side (-ester) chain or at the main chain giving rise to vastly different partial structure factors. Possible correlations to the structure are given. (C) 2000 Elsevier Science B.V. All rights reserved. |