This title appears in the Scientific Report :
2016
Please use the identifier:
http://dx.doi.org/10.1017/S1431927616008758 in citations.
Please use the identifier: http://hdl.handle.net/2128/19362 in citations.
High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated by In Situ TEM and X-ray Diffraction
High Temperature Stability of Amorphous Zn-Sn-O Transparent Conductive Oxides Investigated by In Situ TEM and X-ray Diffraction
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Personal Name(s): | Jeangros, Q. |
---|---|
Duchamp, M. / Rucavado, E. / Landucci, F. / Spori, C. / Dunin-Borkowski, Rafal / Hébert, C. / Morales-Masis, M. / Ballif, C. / Hessler-Wyser, A. | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 Mikrostrukturforschung; PGI-5 |
Published in: | Microscopy and microanalysis, 22 (2016) S3, S. 1582 - 1583 |
Imprint: |
New York, NY
Cambridge University Press
2016
|
Physical Description: |
1582 - 1583 |
DOI: |
10.1017/S1431927616008758 |
Conference: | Microscopy and Microanalysis, Columbus (OH), 2016-07-24 - 2016-07-28 |
Document Type: |
Contribution to a conference proceedings Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/19362 in citations.
Description not available. |