This title appears in the Scientific Report :
2016
Please use the identifier:
http://hdl.handle.net/2128/19360 in citations.
Please use the identifier: http://dx.doi.org/10.1017/S143192761600341X in citations.
Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
Pushing the Limits of Fast Acquisition in TEM Tomography and 4D-STEM
Saved in:
Personal Name(s): | Simson, M. |
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Dunin-Borkowski, Rafal / Hartmann, R. / Huth, M. / Ihle, S. / Jones, L. / Kondo, Y. / Migunov, V. / Nellist, P. D. / Ritz, R. / Ryll, H. / Sagawa, R. / Schmidt, J. / Soltau, H. / Strüder, L. / Yang, H. | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 Mikrostrukturforschung; PGI-5 |
Published in: | Microscopy and microanalysis, 22 (2016) S3, S. 512 - 513 |
Imprint: |
New York, NY
Cambridge University Press
2016
|
Physical Description: |
512 - 513 |
DOI: |
10.1017/S143192761600341X |
Conference: | Microscopy and Microanalysis, Columbus (OH), 2016-07-24 - 2016-07-28 |
Document Type: |
Contribution to a conference proceedings Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1017/S143192761600341X in citations.
Description not available. |