This title appears in the Scientific Report :
2016
Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors
Measurement of atomic eletric fields by scanning transmission electron microscopy (STEM) employing ultrafast detectors
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Personal Name(s): | Müller - Caspary, K. |
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Krause, F. F. / Béché, A. / Duchamp, Martial / Schowalter, M. / Löffler, S. / Migunov, Vadim / Winkler, Florian / Huth, Melanie / Ritz, R. / Ihle, S. / Simson, M. / Ryll, H. / Soltau, H. / Strüder, L. / Zweck, J. / Schattschneider, P. / Dunin-Borkowski, Rafal / Verbeeck, J. / Rosenauer, A. | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 Mikrostrukturforschung; PGI-5 |
Imprint: |
New York, NY
Cambridge University Press
2016
|
Physical Description: |
484 - 485 |
Conference: | Microscopy and Microanalysis, Columbus (OH), 2016-07-24 - 2016-07-28 |
Document Type: |
Contribution to a conference proceedings |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |