This title appears in the Scientific Report :
2016
Please use the identifier:
http://dx.doi.org/10.1017/S1431927616002130 in citations.
Please use the identifier: http://hdl.handle.net/2128/19359 in citations.
Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
Electric and Magnetic Field Mapping With the pnCCD (S)TEM Camera
Saved in:
Personal Name(s): | Huth, M. |
---|---|
Ihle, S. / Ritz, R. / Simson, M. / Soltau, H. / Migunov, V. / Duchamp, M. / Dunin-Borkowski, Rafal / Ryll, H. / Strüder, L. | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 Mikrostrukturforschung; PGI-5 |
Published in: | Microscopy and microanalysis, 22 (2016) S3, S. 256 - 257 |
Imprint: |
New York, NY
Cambridge University Press
2016
|
Physical Description: |
256 - 257 |
DOI: |
10.1017/S1431927616002130 |
Conference: | Microscopy and Microanalysis, Columbus (OH), 2016-07-24 - 2016-07-28 |
Document Type: |
Contribution to a conference proceedings Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/19359 in citations.
Description not available. |