This title appears in the Scientific Report :
2017
Please use the identifier:
http://hdl.handle.net/2128/13880 in citations.
Please use the identifier: http://dx.doi.org/10.1103/PhysRevApplied.5.054009 in citations.
Contact-Free Mapping of Electronic Transport Phenomena of Polar Domains in SrMnO$_{3}$ Films
Contact-Free Mapping of Electronic Transport Phenomena of Polar Domains in SrMnO$_{3}$ Films
High-resolution mapping of electronic transport phenomena plays an increasingly important role for the characterization of ferroic domains and their functionality. At present, spatially resolved electronic transport data are commonly gained from local two-point measurements, collected in line-by-lin...
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Personal Name(s): | Schaab, J. |
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Krug, I. P. / Doğanay, H. / Hackl, J. / Gottlob, D. M. / Khan, M. I. / Nemšák, S. / Maurel, L. / Langenberg, E. / Algarabel, P. A. / Pardo, J. A. / Schneider, C. M. / Meier, D. (Corresponding author) | |
Contributing Institute: |
Elektronische Eigenschaften; PGI-6 |
Published in: | Physical review applied, 5 (2016) 5, S. 054009 |
Imprint: |
College Park, Md. [u.a.]
American Physical Society
2016
|
DOI: |
10.1103/PhysRevApplied.5.054009 |
Document Type: |
Journal Article |
Research Program: |
Controlling Spin-Based Phenomena |
Link: |
OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1103/PhysRevApplied.5.054009 in citations.
High-resolution mapping of electronic transport phenomena plays an increasingly important role for the characterization of ferroic domains and their functionality. At present, spatially resolved electronic transport data are commonly gained from local two-point measurements, collected in line-by-line scans with a conducting nanosized probe. Here, we introduce an innovative experimental approach based on low-energy electron microscopy. As a model case, we study polar domains of varying conductance in strained SrMnO3. By a direct comparison with conductive atomic force and electrostatic force microscopy, we reveal that the applied low-energy electron-microscopy experiment can be considered as an inverse I(V) measurement, providing access to the local electronic conductance with nanoscale resolution and short data-acquisition times in the order of 10–102 ms. Low-energy electrons thus hold yet unexplored application opportunities as a minimal-invasive probe for local electronic transport phenomena, opening a promising route towards spatially resolved, high-throughput sampling at the nanoscale. |