This title appears in the Scientific Report :
2017
Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays
Introduction to a special issue on Frontieres of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays
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Personal Name(s): | Dunin-Borkowski, Rafal |
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Mayer, Joachim / Tillmann, Karsten | |
Contributing Institute: |
Mikrostrukturforschung; PGI-5 Technische und administrative Infrastruktur; ER-C-KI Physik Nanoskaliger Systeme; ER-C-1 |
Published in: | 2016 |
Imprint: |
Amsterdam
Elsevier Science
2016
|
Physical Description: |
0304 - 3991 |
Conference: | PICO 2017, Kasteel Vaalsbroek (The Netherlands), 2017-04-30 - 2017-05-04 |
Document Type: |
Contribution to a conference proceedings |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |