This title appears in the Scientific Report :
2017
Random telegraph noise analysis in Redox-based Resistive Switching Devices Using KMC Simulations
Random telegraph noise analysis in Redox-based Resistive Switching Devices Using KMC Simulations
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Personal Name(s): | Abbaspour, E. |
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Menzel, Stephan / Jungemann, C. | |
Contributing Institute: |
Elektronische Materialien; PGI-7 JARA-FIT; JARA-FIT |
Imprint: |
2017
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Conference: | International Conference on Simulation of Semiconductor Processes and Devices, Kamakura (Japan), 2017-09-07 - 2017-09-09 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Publikationsportal JuSER |
Description not available. |