This title appears in the Scientific Report :
2018
Please use the identifier:
http://dx.doi.org/10.1017/S1431927617001751 in citations.
Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy
Electron Microscopy (Big and Small) Data Analysis With the Open Source Software Package HyperSpy
Saved in:
Personal Name(s): | de la Pena, Francisco |
---|---|
Ostasevicius, Tomas / Tonaas Fauske, Vidar / Burdet, Pierre / Jokubauskas, Petras / Nord, Magnus / Sarahan, Mike / Prestat, Eric / Johnstone, Duncan N. / Taillon, Joshua / Caron, Jan / Furnival, Tom / MacArthur, Katherine / Eljarrat, Alberto / Mazzucco, Stefano / Migunov, Vadim / Aarholt, Thomas / Walls, Michael / Winkler, Florian / Donval, Gael / Martineau, Ben / Garmannslund, Andreas / Zagonel, Luiz-Fernando / Iyengar, Ilya | |
Contributing Institute: |
Materialwissenschaft u. Werkstofftechnik; ER-C-2 |
Published in: | Microscopy and microanalysis, 23 (2017) S1, S. 214 - 215 |
Imprint: |
New York, NY
Cambridge University Press
2017
|
DOI: |
10.1017/S1431927617001751 |
Document Type: |
Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |