This title appears in the Scientific Report :
2010
Please use the identifier:
http://dx.doi.org/10.1002/er.1634 in citations.
Tomographic diagnostics of current distributions in a fuel cell stack
Tomographic diagnostics of current distributions in a fuel cell stack
A novel tomographic scheme for analysing the state of any single membrane electrode assembly (MEA) in a stack is suggested. Plates of very high conductivity placed between every fuel cell and slitted in an appropriate manner cause surface currents at well-defined locations of the stack. We show that...
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Personal Name(s): | Hirschfeld, J.A. |
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Lustfeld, H. / Reißel, M. / Steffen, B. | |
Contributing Institute: |
Quanten-Theorie der Materialien; IAS-1 Jülich Supercomputing Center; JSC Quanten-Theorie der Materialien; IFF-1 |
Published in: | International journal of energy research, 34 (2010) S. 284 - 292 |
Imprint: |
London [u.a.]
Wiley-Intersience
2010
|
Physical Description: |
284 - 292 |
DOI: |
10.1002/er.1634 |
Document Type: |
Journal Article |
Research Program: |
Computational Science and Mathematical Methods Kondensierte Materie Scientific Computing |
Series Title: |
International Journal of Energy Research
34 |
Subject (ZB): | |
Publikationsportal JuSER |
A novel tomographic scheme for analysing the state of any single membrane electrode assembly (MEA) in a stack is suggested. Plates of very high conductivity placed between every fuel cell and slitted in an appropriate manner cause surface currents at well-defined locations of the stack. We show that knowing these surface currents, information about anomalies of the currents in a MEA can be obtained using the methods of tomography. The results are mathematically not unique. However, when assuming plausible defect structures, one can exclude improbable deficiencies by applying a special form of simulated annealing. We present numerical calculations of typical examples demonstrating that the essential defects of the MEA in any single cell of the stack can be detected and their extent can be determined. Copyright (C) 2009 John Wiley & Sons, Ltd. |