Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
Measurement of Atomic Electric Fields by Scanning Transmission Electron Microscopy (STEM) Employing Ultrafast Detectors
Saved in:
Personal Name(s): | Müller-Caspary, Knut |
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Krause, Florian F. / Béché, Armand / Duchamp, Martial / Schowalter, Marco / Löffler, Stefan / Migunov, Vadim / Winkler, Florian / Huth, Martin / Ritz, Robert / Ihle, Sebastian / Simson, Martin / Ryll, Henning / Soltau, Heike / Strüder, Lothar / Zweck, Josef / Schattschneider, Peter / Dunin-Borkowski, Rafal / Verbeeck, Johan / Rosenauer, Andreas | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 |
Published in: | Microscopy and microanalysis, 22 (2016) S3, S. 484 - 485 |
Imprint: |
New York, NY
Cambridge University Press
2016
|
DOI: |
10.1017/S1431927616003275 |
Document Type: |
Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |