This title appears in the Scientific Report :
2019
Please use the identifier:
http://dx.doi.org/10.1038/s41598-019-39372-2 in citations.
Please use the identifier: http://hdl.handle.net/2128/21786 in citations.
Current channeling along extended defects during electroreduction of SrTiO3
Current channeling along extended defects during electroreduction of SrTiO3
Electroreduction experiments on metal oxides are well established for investigating the nature of the material change in memresistive devices, whose basic working principle is an electrically-induced reduction. While numerous research studies on this topic have been conducted, the influence of exten...
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Personal Name(s): | Rodenbücher, Christian (Corresponding author) |
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Menzel, Stephan / Wrana, Dominik / Gensch, Thomas / Korte, Carsten / Krok, Franciszek / Szot, Krzysztof | |
Contributing Institute: |
Elektronische Materialien; PGI-7 Technoökonomische Systemanalyse; IEK-3 Zelluläre Biophysik; ICS-4 |
Published in: | Scientific reports, 9 (2019) 1, S. 2502 |
Imprint: |
[London]
Macmillan Publishers Limited, part of Springer Nature
2019
|
DOI: |
10.1038/s41598-019-39372-2 |
PubMed ID: |
30792458 |
Document Type: |
Journal Article |
Research Program: |
Engineering Cell Function |
Link: |
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Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/21786 in citations.
Electroreduction experiments on metal oxides are well established for investigating the nature of the material change in memresistive devices, whose basic working principle is an electrically-induced reduction. While numerous research studies on this topic have been conducted, the influence of extended defects such as dislocations has not been addressed in detail hitherto. Here, we show by employing thermal microscopy to detect local Joule heating effects in the first stage of electroreduction of SrTiO3 that the current is channelled along extended defects such as dislocations which were introduced mechanically by scratching or sawing. After prolonged degradation, the matrix of the crystal is also electroreduced and the influence of the initially present dislocations diminished. At this stage, a hotspot at the anode develops due to stoichiometry polarisation leading not only to the gliding of existing dislocations, but also to the evolution of new dislocations. Such a formation is caused by electrical and thermal stress showing dislocations may play a significant role in resistive switching effects. |