Angular Resolved Scattering Measurements as Quality Control Tool for Texture-Etched ZnO:Al Front Contacts
Angular Resolved Scattering Measurements as Quality Control Tool for Texture-Etched ZnO:Al Front Contacts
The texture of the transparent front contact is of major importance with respect to the optical performance of a thin-film silicon solar cell. In this study we address the method of angular resolved scattering as a tool to characterize the transparent conductive oxide surface texture. Using variousl...
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Personal Name(s): | Jost, G. |
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Merdzhanova, T. / Zimmermann, T. / Kirchhoff, Joachim / Hüpkes, J. (Corresponding author) | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Imprint: |
WIP
2012
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DOI: |
10.4229/27thEUPVSEC2012-3DV.1.33 |
Conference: | 27th European Photovoltaic Conference, Frankfurt (Germany), 2012-09-24 - 2012-09-28 |
Document Type: |
Proceedings Book |
Research Program: |
Solar cells of the next generation |
Series Title: |
Proceedings of the 27th European Photovoltaic Conference
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Publikationsportal JuSER |
The texture of the transparent front contact is of major importance with respect to the optical performance of a thin-film silicon solar cell. In this study we address the method of angular resolved scattering as a tool to characterize the transparent conductive oxide surface texture. Using variously etched sputter-deposited aluminum doped zinc oxide films correlations between the scattering characteristics of the front contacts and the current generation of different solar cells are investigated. In order to simplify the characterization only discrete angles are used as a fingerprint. Thus, correlations between the front contact scattering and current of a-Si:H and μc- Si:H single junction solar cells as well as a-Si:H/μc-Si:H tandem junction solar cells are established. It is well known that the texture does not only influence the optical performance of the device but also the growth processes of the successive layers. Especially the growth of the μc-Si:H absorber is very sensitive to the front contact texture. Therefore the correlation between the light scattering based texture fingerprint of the front contact and the crystalline volume fraction of the μc-Si-H absorber layer is investigated. |