This title appears in the Scientific Report :
2019
Please use the identifier:
http://dx.doi.org/10.1021/acsaem.9b01172 in citations.
Electron-Beam-Induced Current Measurements of Thin-Film Solar Cells
Electron-Beam-Induced Current Measurements of Thin-Film Solar Cells
The present tutorial review provides a practical guide to the analysis of semiconductor devices using electron-beam-induced currents (EBICs). The authors focus on cross-sectional EBIC measurements that provide an experimental assay of the efficiency of charge carrier collection in a semiconductor di...
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Personal Name(s): | Abou-Ras, Daniel |
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Kirchartz, Thomas (Corresponding author) | |
Contributing Institute: |
Photovoltaik; IEK-5 |
Published in: | ACS applied energy materials, 2 (2019) 9, S. 6127 - 6139 |
Imprint: |
Washington, DC
ACS Publications
2019
|
DOI: |
10.1021/acsaem.9b01172 |
Document Type: |
Journal Article |
Research Program: |
Solar cells of the next generation |
Publikationsportal JuSER |
The present tutorial review provides a practical guide to the analysis of semiconductor devices using electron-beam-induced currents (EBICs). The authors focus on cross-sectional EBIC measurements that provide an experimental assay of the efficiency of charge carrier collection in a semiconductor diode. The tutorial covers the fundamental physics of the technique, specimen preparation, data acquisition, and numerical simulation and analysis of the experimental data. A key focus is put on application cases from the field of thin-film photovoltaics as well as specific pitfalls that may occur, such as effects occurring under high-level injection and at grain boundaries of polycrystalline materials. |