Hyperfeineigenschaften und Gitterrelaxationen von Defekten in Halbleitern und Metallen
Hyperfeineigenschaften und Gitterrelaxationen von Defekten in Halbleitern und Metallen
The electronic and geometrical structures, in particular the electric field gradients (EFGs), of [CdD]$^{-}$ (D=P, As, Sb) acceptor-donor pairs in Si and Ge are studied using the full potential Korringa-Kohn-Rostoker (KKR) Green's function method. Since the EFG depends very sensitively an latti...
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Personal Name(s): | Settels, A. (Corresponding author) |
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Contributing Institute: |
Publikationen vor 2000; PRE-2000; Retrocat |
Imprint: |
Jülich
Forschungszentrum Jülich, Zentralbibliothek, Verlag
2000
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Physical Description: |
II, 201 p. |
Document Type: |
Report Book |
Research Program: |
ohne Topic |
Series Title: |
Berichte des Forschungszentrums Jülich
3731 |
Link: |
OpenAccess OpenAccess |
Publikationsportal JuSER |
The electronic and geometrical structures, in particular the electric field gradients (EFGs), of [CdD]$^{-}$ (D=P, As, Sb) acceptor-donor pairs in Si and Ge are studied using the full potential Korringa-Kohn-Rostoker (KKR) Green's function method. Since the EFG depends very sensitively an lattice relaxations, the method is extended to treat large displacements with higher accuracy and less computing time. The efficiency is demonstrated for impurities in semiconductors and metals. The hyperfine fields of 5$\textit{sp}$- und 6$\textit{sp}$-defects in Fe are also calculated. In the case of [InD]° the calculated geometrical structures are compared with pseudopotential results and are in quite good agreement. The EFGs for [CdD]$^{0/-}$ complexes and for the trimers [CdD$_{2}$] (D=P, As) in the relaxed positions agree well with experimental results. In all cases the origin of the EFGs can be qualitatively understood by simple hybridization models. |