This title appears in the Scientific Report :
2020
Please use the identifier:
http://dx.doi.org/10.1038/s41467-020-17104-9 in citations.
Please use the identifier: http://hdl.handle.net/2128/25265 in citations.
Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
While intensive efforts have been devoted to studying the nature of the solid-electrolyte interphase (SEI), little attention has been paid to understanding its role in the mechanical failures of electrodes. Here we unveil the impact of SEI inhomogeneities on early-stage defect formation in Si electr...
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Personal Name(s): | Chen, Chunguang (Corresponding author) |
---|---|
Zhou, Tao / Danilov, Dmitri L. / Gao, Lu / Benning, Svenja / Schön, Nino / Tardif, Samuel / Simons, Hugh / Hausen, Florian / Schülli, Tobias U. / Eichel, R.-A. / Notten, Peter H. L. (Corresponding author) | |
Contributing Institute: |
Grundlagen der Elektrochemie; IEK-9 |
Published in: | Nature Communications, 11 (2020) 1, S. 3283 |
Imprint: |
[London]
Nature Publishing Group UK
2020
|
DOI: |
10.1038/s41467-020-17104-9 |
PubMed ID: |
32612261 |
Document Type: |
Journal Article |
Research Program: |
Helmholtz Interdisciplinary Doctoral Training in Energy and Climate Research (HITEC) Electrochemical Storage |
Link: |
Get full text Get full text OpenAccess OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/25265 in citations.
While intensive efforts have been devoted to studying the nature of the solid-electrolyte interphase (SEI), little attention has been paid to understanding its role in the mechanical failures of electrodes. Here we unveil the impact of SEI inhomogeneities on early-stage defect formation in Si electrodes. Buried under the SEI, these early-stage defects are inaccessible by most surface-probing techniques. With operando full field diffraction X-ray microscopy, we observe the formation of these defects in real time and connect their origin to a heterogeneous degree of lithiation. This heterogeneous lithiation is further correlated to inhomogeneities in topography and lithium-ion mobility in both the inner- and outer-SEI, thanks to a combination of operando atomic force microscopy, electrochemical strain microscopy and sputter-etched X-ray photoelectron spectroscopy. Our multi-modal study bridges observations across the multi-level interfaces (Si/LixSi/inner-SEI/outer-SEI), thus offering novel insights into the impact of SEI homogeneities on the structural stability of Si-based lithium-ion batteries. |