This title appears in the Scientific Report :
2020
Scanning Electron Microscopy
Scanning Electron Microscopy
Saved in:
Personal Name(s): | Förster, Beate (Corresponding author) |
---|---|
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 |
Published in: |
Scattering! Soft Functional and Quantum Materials |
Imprint: |
Zentralbibliothek
Forschungszentrum Jülich GmbH
2019
|
Physical Description: |
F4.2-F4.12 |
Conference: | 50th IFF Spring School 2019 (Germany), 2019-03-11 - 2019-03-22 |
Document Type: |
Contribution to a conference proceedings Contribution to a book |
Research Program: |
Controlling Configuration-Based Phenomena |
Series Title: |
Verlag, Schriften des Forschungszentrums Jülich Reihe Schlüsseltechnologien / Key Technologies
190 |
Publikationsportal JuSER |
Description not available. |