This title appears in the Scientific Report :
2020
Please use the identifier:
http://dx.doi.org/10.1017/S1431927619001016 in citations.
Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures
Focused Electron-Beam Induced Deposition, In Situ TEM And Off-Axis Electron Holography Investigation of Bi-Magnetic Core-Shell Nanostructures
Saved in:
Personal Name(s): | Almeida, Trevor P. (Corresponding author) |
---|---|
McGrouther, Damien / Kovács, András / Dunin-Borkowski, Rafal E. / McVitie, Stephen | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 |
Published in: | Microscopy and microanalysis, 25 (2019) S2, S. 56 - 57 |
Imprint: |
New York, NY
Cambridge University Press
2019
|
DOI: |
10.1017/S1431927619001016 |
Document Type: |
Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |