This title appears in the Scientific Report :
2020
Measuring polarization induced electric fields in AlGaN/GaN nanowires using nano-beam electron diffraction and momentum-resolved 4D-STEM”
Measuring polarization induced electric fields in AlGaN/GaN nanowires using nano-beam electron diffraction and momentum-resolved 4D-STEM”
Saved in:
Personal Name(s): | Grieb, Tim |
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Müller-Caspary, Knut / Van Aert, Sandra / Eickhoff, Martin / Soltau, Heike / Rosenauer, Andreas / Müßener, Jan / Gauquelin, Nicolas / Ritz, Robert / Simson, Martin / Hille, Pascal / Schörmann, Jörg / Verbeeck, Johan | |
Contributing Institute: |
Physik Nanoskaliger Systeme; ER-C-1 |
Imprint: |
2019
|
Conference: | 21st International Conference on Microscopy of Semiconducting Materials, Cambridge (UK), 2020-04-09 - 2020-04-12 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |