This title appears in the Scientific Report :
2020
From structural of functional characterisation:Measurement of atomic electric fields and polarisations by momentum-resolved STEM
From structural of functional characterisation:Measurement of atomic electric fields and polarisations by momentum-resolved STEM
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Personal Name(s): | Müller-Caspary, Knut |
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Krause, Florian / Grieb, Tim / Winkler, Florian / Duchamp, Martial / Béché, Armand / Schowalter, Marco / Migunov, Vadim / Barthel, Juri / Soltau, Heike / Dunin-Borkowski, Rafal / Verbeeck, Johan / Van Aert, Sandra / Rosenauer, Andreas | |
Contributing Institute: |
Mikrostrukturforschung; PGI-5 Physik Nanoskaliger Systeme; ER-C-1 |
Imprint: |
2019
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Conference: | 5th Conference on Frontiers of Aberration Corrected Electron Microscopy PICO 2019, Vaalsbroek (The Netherlands), 2019-05-06 - 2019-05-10 |
Document Type: |
Conference Presentation |
Research Program: |
Controlling Configuration-Based Phenomena |
Publikationsportal JuSER |
Description not available. |