This title appears in the Scientific Report :
2020
Please use the identifier:
http://dx.doi.org/10.1002/adfm.202004767 in citations.
Please use the identifier: http://hdl.handle.net/2128/26314 in citations.
Phonon‐Enhanced Near‐Field Spectroscopy to Extract the Local Electronic Properties of Buried 2D Electron Systems in Oxide Heterostructures
Phonon‐Enhanced Near‐Field Spectroscopy to Extract the Local Electronic Properties of Buried 2D Electron Systems in Oxide Heterostructures
In the family of functional oxide materials, the interface between LaAlO3 and SrTiO3 (LAO/STO) is an interesting example, as both materials are large‐bandgap insulators in their bulk state but give rise to a confined 2D electron gas (2DEG) when combined through thin‐film deposition. While this 2DEG...
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Personal Name(s): | Barnett, Julian |
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Rose, Marc‐André / Ulrich, Georg / Lewin, Martin / Kästner, Bernd / Hoehl, Arne / Dittmann, Regina / Gunkel, Felix / Taubner, Thomas (Corresponding author) | |
Contributing Institute: |
JARA-FIT; JARA-FIT Elektronische Materialien; PGI-7 |
Published in: | Advanced functional materials, 30 (2020) 46, S. 2004767 |
Imprint: |
Weinheim
Wiley-VCH
2020
|
DOI: |
10.1002/adfm.202004767 |
Document Type: |
Journal Article |
Research Program: |
Controlling Collective States |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/26314 in citations.
In the family of functional oxide materials, the interface between LaAlO3 and SrTiO3 (LAO/STO) is an interesting example, as both materials are large‐bandgap insulators in their bulk state but give rise to a confined 2D electron gas (2DEG) when combined through thin‐film deposition. While this 2DEG exhibits remarkable properties, its experimental investigation is mostly limited to destructive or non‐local (i.e. averaging over larger areas) methods until recently. Scanning near‐field optical microscopy is shown to overcome this limitation, detecting buried 2DEGs by using highly confined optical near‐fields. Here, a full spectroscopic approach with phonon‐enhancement and simulations based on the finite dipole model is combined to extract quantitative electronic properties of the interfacial LAO/STO 2DEG. This threefold improvement compared to previous work will enable the quantitative nanoscale, non‐destructive, sub‐surface analysis of complex oxide thin films and interfaces, as well as similar heterostructures. |