This title appears in the Scientific Report :
2014
Please use the identifier:
http://dx.doi.org/10.1149/06414.0003ecst in citations.
(Keynote) Atomic Scale and Interface Interactions in Redox-Based Resistive Switching Memories
(Keynote) Atomic Scale and Interface Interactions in Redox-Based Resistive Switching Memories
Saved in:
Personal Name(s): | Valov, I. (Corresponding Author) |
---|---|
Tappertzhofen, S. / Linn, E. / Menzel, S. / van den Hurk, J. / Waser, R. | |
Contributing Institute: |
Elektronische Materialien; PGI-7 |
Imprint: |
Pennington, NJ
Electrochemical Society (ECS)
2014
|
Physical Description: |
3 - 18 |
DOI: |
10.1149/06414.0003ecst |
Document Type: |
Contribution to a book |
Research Program: |
Frontiers of charge based Electronics |
Series Title: |
ECS transactions
64 |
Publikationsportal JuSER |
Description not available. |