This title appears in the Scientific Report :
2020
Interface characterization of in-situ grown metal/oxide/metal stacks for future ReRAM applications
Interface characterization of in-situ grown metal/oxide/metal stacks for future ReRAM applications
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Personal Name(s): | Bente, Ivonne (Corresponding author) |
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Contributing Institute: |
JARA-FIT; JARA-FIT Elektronische Materialien; PGI-7 |
Imprint: |
2020
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Physical Description: |
70 |
Dissertation Note: |
Masterarbeit, RWTH Aachen University, 2020 |
Document Type: |
Master Thesis |
Research Program: |
Controlling Electron Charge-Based Phenomena |
Publikationsportal JuSER |
Description not available. |