This title appears in the Scientific Report :
2021
Please use the identifier:
http://dx.doi.org/10.1017/S1431927620024605 in citations.
Please use the identifier: http://hdl.handle.net/2128/27557 in citations.
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
Inelastic Scattering in Electron Backscatter Diffraction and Electron Channeling Contrast Imaging
Electron backscatter diffraction (EBSD) and electron channeling contrast imaging (ECCI) are used to extract crystallographic information from bulk samples, such as their crystal structure and orientation as well as the presence of any dislocation and grain boundary defects. These techniques rely on...
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Personal Name(s): | Mendis, Budhika G. (Corresponding author) |
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Barthel, Juri / Findlay, Scott D. / Allen, Leslie J. | |
Contributing Institute: |
Materialwissenschaft u. Werkstofftechnik; ER-C-2 |
Published in: | Microscopy and microanalysis, 26 (2020) 6, S. 1147 - 1157 |
Imprint: |
New York, NY
Cambridge University Press
2020
|
DOI: |
10.1017/S1431927620024605 |
Document Type: |
Journal Article |
Research Program: |
Controlling Configuration-Based Phenomena |
Link: |
Get full text Published on 2020-11-16. Available in OpenAccess from 2021-05-16. |
Publikationsportal JuSER |
Please use the identifier: http://hdl.handle.net/2128/27557 in citations.
Electron backscatter diffraction (EBSD) and electron channeling contrast imaging (ECCI) are used to extract crystallographic information from bulk samples, such as their crystal structure and orientation as well as the presence of any dislocation and grain boundary defects. These techniques rely on the backscattered electron signal, which has a large distribution in electron energy. Here, the influence of plasmon excitations on EBSD patterns and ECCI dislocation images is uncovered by multislice simulations including inelastic scattering. It is shown that the Kikuchi band contrast in an EBSD pattern for silicon is maximum at small energy loss (i.e., few plasmon scattering events following backscattering), consistent with previous energy-filtered EBSD measurements. On the other hand, plasmon excitation has very little effect on the ECCI image of a dislocation. These results are explained by examining the role of the characteristic plasmon scattering angle on the intrinsic contrast mechanisms in EBSD and ECCI. |