This title appears in the Scientific Report :
2021
Please use the identifier:
http://hdl.handle.net/2128/29824 in citations.
Please use the identifier: http://dx.doi.org/10.1002/pssr.202100012 in citations.
Impact of Iridium Oxide Electrodes on the Ferroelectric Phase of Thin Hf 0.5 Zr 0.5 O 2 Films
Impact of Iridium Oxide Electrodes on the Ferroelectric Phase of Thin Hf 0.5 Zr 0.5 O 2 Films
Saved in:
Personal Name(s): | Mittmann, Terence |
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Szyjka, Thomas / Alex, Hsain / Istrate, Marian Cosmin / Lomenzo, Patrick D. / Baumgarten, Lutz / Müller, Martina / Jones, Jacob L. / Pintilie, Lucian / Mikolajick, Thomas / Schroeder, Uwe (Corresponding author) | |
Contributing Institute: |
Elektronische Eigenschaften; PGI-6 |
Published in: | Physica status solidi / Rapid research letters, 15 (2021) 5, S. 2100012 - |
Imprint: |
Weinheim
Wiley-VCH
2021
|
DOI: |
10.1002/pssr.202100012 |
Document Type: |
Journal Article |
Research Program: |
Materials and Interfaces |
Link: |
OpenAccess |
Publikationsportal JuSER |
Please use the identifier: http://dx.doi.org/10.1002/pssr.202100012 in citations.
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