Classification
FAF - Materials research - comprehensive works
FHA - Materials characterization - general aspects
4
FGML - Characterization of electronic materials
2
AHXB - Archaeology
1
FFPE - Thin film electronic properties, semiconductor interfaces
1
FGK - Thin film technology, epitaxy
1
FHE - Imaging methods in materials characterization
1
FJNC - Optical spectroscopy in solids
1
FPM - Materials testing - general aspects
1