Classification
FHE - Imaging methods in materials characterization
64
FHEG - Tunneling microscopy, force microscopy
32
FHEC - Optical microscopy in materials characterization
19
FHG - Electron microscopy
12
FHEM - Image analysis in microscopy, stereology
8
FHEE - X-ray microscopy, surface topography
6
FHEH - Ion microscopy
5
DYK - Image processing
4
CUH - Luminescence, fluorescence analysis
3
FAN - Solid state physics - mathematical methods, computer applications
3
FHA - Materials characterization - general aspects
3
FNPE - Nanostructured materials
3
FHAB - Surface and thin film characterization
2
FHC - Diffraction methods in materials characterization
2
FKG - Magnetic materials
2
CTHD - Potentiometry
1
CUK - X-ray spectroscopy
1
CUSE - Raman spectroscopy
1
DPA - Electronic data processing - applications
1
EISF - Thin film solar cells
1
FAHH - Materials research - historical aspects
1
FANE - Computational solid state physics
1
FFGH - Electron emission, field emission
1
FGM - Microelectronic technology
1
FHCH - Microstructural analysis
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
FJH - Semiconductor physics
1
FMGH - Metallographic microscopy, metallographic stereology
1
FMHF - Grain boundaries, polycrystals
1
FNX - Carbon, carbon materials
1
HCR - Imaging techniques in medicine
1
LAL - Biology - general aspects
1
LHH - Microbiology - methods
1
PEDA - Electron radiation, electron optics
1
TBT - Optoelectronics, optical fibers, displays
1