Classification
FHCB - X-ray scattering
36
FHN - Neutron scattering
20
FCAB - X-ray crystallography, X-ray diffraction
7
FHA - Materials characterization - general aspects
5
FHCD - Small angle scattering
5
FHL - Synchrotron radiation techniques
5
CUK - X-ray spectroscopy
4
CUS - Light scattering
4
FGN - Nanotechnology
4
FHCF - Defect characterization
4
LMH - Biophysics - methods
4
FFJ - Surface structure, gas solid interface
3
FFJE - Molecular surface processes, gas surface interaction, adsorption
3
FHC - Diffraction methods in materials characterization
3
FJHE - Defects and radiation effects in semiconductors
3
FNPE - Nanostructured materials
3
CHGM - Physical chemistry of organic compounds - incl. physical properties
2
FAF - Materials research - comprehensive works
2
FCAD - Crystal structure analysis
2
FDFE - Radiation effects in nonmetals, optical radiation effects
2
FFP - Physics of thin films
2
FGK - Thin film technology, epitaxy
2
FHE - Imaging methods in materials characterization
2
FHEE - X-ray microscopy, surface topography
2
FHLB - Soft X-ray spectroscopy
2
FKG - Magnetic materials
2
FNG - Polymer structure, polymer dynamics
2
FNV - Composite materials, fiber materials
2
LLE - Protein chemistry - general aspects
2
CHRM - Liquids and their properties
1
CLJ - Catalyst materials
1
CLPD - Disperse systems
1
CUO - Molecular spectroscopy
1
ETFG - Polymer electrolyte membrane fuel cells ( PEMFC )
1
FCA - Crystallography
1
FCG - Lattice dynamics
1
FEAH - Ordering and dynamical processes in condensed matter
1
FECE - Critical phenomena
1
FFJB - Surface dynamics
1
FFM - Liquid interfaces, adhesion
1
FFPG - Multilayer systems, quantum structures
1
FGML - Characterization of electronic materials
1
FHAB - Surface and thin film characterization
1
FHJC - Microbeam analysis
1
FHTD - Mössbauer spectroscopy
1
FJC - Electronic properties of solids
1
FJKC - III - V semiconductors
1
FKGM - Magnetic films
1
FMB - Physical metallurgy - general aspects
1
FNCG - Specific molecular crystals
1
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